News

MI Announces a Joint Research Collaboration with The National Institute of Standards and Technology (NIST)

July 18, 2017

July 15th, 2017, 08:00 AM Eastern Daylight Time

Measurements International (MI) Announces a Joint Research Collaboration with The National Institute of Standards and Technology (NIST) to Develop a Commercial Graphene Based Quantum Hall System.

PRESCOTT, Ontario – Measurements International (MI) a Metrology Based Company focused on developing products for Electrical Metrology at the primary standards level today announced a joint research collaboration to explore graphene-based Quantum Hall Device with the National Institute of Standards and Technology (NIST).

NIST will contribute its part of the collaboration in the study of graphene quantum Hall resistors. Graphene has the goal to replace the current generation of standards fabricated from gallium arsenide (GaAs) and aluminum gallium arsenide (AlGaAs). Graphene promises a practical device for measuring electrical resistance that is to be easier and less expensive to make, and less demanding to operate, than the current generation of standards fabricated from gallium arsenide (GaAs) and aluminum gallium arsenide (AlGaAs).

Measurements International is contributing the commercial Quantum Hall system which will be modified to allow for dual sample mount probe.  This is already available in the 6800B system and allows the mounting of both the gallium arsenide (GaAs) and the new graphene-based device.

The cryogenics of the system which is based on a reliquifier system which does not require the transfer or need for purchase of liquid helium, and instead uses helium gas in a reliquifier for a cost-effective solution. This is the only system commercially available of its kind. For more on the 6800 systems please visit http://mintl.com/products/6800b-qhr-turnkey-system-with-helium-re-liquefaction/

The system will also use Measurements International room temperature DCC Bridge the 6020Q.  The bridge offers a cheaper, more cost-effective solution the Cryogenic Current Comparators without large sacrifice inaccuracy or uncertainty. For more on the 6020Q please visit http://mintl.com/products/6020q/

 

Company President Duane Brown:

“We are delighted to be chosen by NIST as its partner for this leading-edge research project.  Measurements International has been offering the very best Commercial QHR System since 1999, and we believe this shows the Measurement Communities continued trust in MI Products.”

For more information please visit the following:

 

A Cheaper, Easier Resistance Standard on a Chip

IEEE Spectrum

Researchers at the (NIST, Gaithersburg, Md.) and Carnegie Mellon University in Pittsburgh, Pa., have deposited a graphene film on silicon carbide to produce a quantized ohm-on-a-chip.

http://spectrum.ieee.org/tech-talk/at-work/test-and-measurement/a-cheaper-easier-resistance-standard-on-a-chip

 

Contact:

MI Contact

Ryan Brown

VP of Operations

ryanbrown@mintl.com

Measurements International Attending Conference on Precision Electromagnetic Measurements (CPEM) 2018

July 5, 2018

CPEM 2018 Paris, France July 8th – 13th, 2018 Measurements International (MI) is pleased to announce GOLD Sponsorship for the CPEM Conference July 8th – 13th in Paris, France.  We invite you to visit our booth (booth 21) to see new and exciting products from MI as well as discuss our new research projects on […]

Measurements International Announces joint research collaboration agreement with METAS

May 1, 2018

Measurements International (MI) Announces a Joint Collaboration with The Federal Institute of Metrology (METAS) to Develop an Impedance Simulator.

PRESCOTT, Ontario – Measurements International (MI) a Metrology Based Company focused on developing products for Electrical Metrology at the primary standards level today announced a Joint Collaboration with The Federal Institute of Metrology (METAS) to develop an Impedance Simulator.

Metrologist Magazine Press Release

April 2, 2018

Measurements International was featured in the January edition of Metrologist Magazine.

The article titled “Measurements International 30 Years of Measurements Uncertainty” is a brief history and overview of Measurements International.

For a link to the article visit:
Metrologist Magazine Issue January 2018

Metrologist Magazine is NCSLI’s most recent publication, printing quarterly since 2008.